- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 31/27 - Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements
Patent holdings for IPC class G01R 31/27
Total number of patents in this class: 203
10-year publication summary
|
14
|
13
|
20
|
17
|
25
|
31
|
21
|
23
|
16
|
14
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Samsung Electronics Co., Ltd. | 131630 |
10 |
| Tokyo Electron Limited | 11599 |
9 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
8 |
| Mitsubishi Electric Corporation | 43934 |
8 |
| Intel Corporation | 45621 |
7 |
| Delphi Technologies IP Limited | 1081 |
6 |
| Infineon Technologies AG | 8189 |
5 |
| Rohm Co., Ltd. | 5843 |
5 |
| Siemens AG | 24990 |
4 |
| STMicroelectronics (Crolles 2) SAS | 634 |
4 |
| International Business Machines Corporation | 60644 |
3 |
| Renesas Electronics Corporation | 6305 |
3 |
| ABB Schweiz AG | 6321 |
3 |
| Dialight Corporation | 233 |
3 |
| Teradyne, Inc. | 579 |
3 |
| Micron Technology, Inc. | 24960 |
2 |
| Robert Bosch GmbH | 40953 |
2 |
| Semiconductor Energy Laboratory Co., Ltd. | 10902 |
2 |
| Industrial Technology Research Institute | 4898 |
2 |
| Seagate Technology LLC | 4228 |
2 |
| Other owners | 112 |